Click Here to

Request a Quote

Non Contact Type Features / Specification Substrates
PN-50 alpha
  • Non-contact and compact PN type checker
  • Principle: Photovoltaic effect
  • No damage and no stain by Non-contact method
  • Possible to check even oxidized film on water surface
  • Instantly P/N discrimination
  • Checking range:
    (Resistivity)
    0.1 Ohm-cm to 1000 Ohm-cm
    (Depends on surface conditions)
    (Thickness)
    Up to approx. 3mm
  • Available to build into an automatic wafer loading / unloading system (PN-80 alpha)

Silicon wafers
- Lapped
- Etched
- Polished
- Mirror
- Bulk

PN-12 alpha
  • Contact PN type checker for low to high wide range resistivity
  • Principle: Thermo-electromotive force method (seebek effect)
  • Electrode: Hot probe and Cold probe
  • Possible to check most figure of sample (Silicon wafer, Bulk, Ingot and so on) (Oxidized film on wafer surface: Not available)
  • Equipped with Thermometer and Analogue meter
  • Checking range:
    (Resistivity) 1m Ohm-cm to 20 K Ohm-cm
  • Available to build into an automatic wafer loading / unloading system (PN-12 beta)

Silicon wafers
- Lapped
- Etched
- Polished
- Mirror
- Bulk

Silicon ingots

 


  Copyright 2005 3T & Associates, Inc., All Right Reserved.